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专利名称：Three- dimensional measuring system发明人：Kubo, Akira,Horita, Shinichi,Abe, Yoshihisa申请号：EP05024134.8申请日：20051104公开号：EP1736731A3公开日：20091125
专利附图：
摘要：A three-dimensional measuring system for measuring a three-dimensionalshape of a measurement object in a noncontact manner includes a first obtaining portionfor obtaining arrangement information of the measurement object, a second obtainingportion for obtaining design shape information of the measurement object, a fourth
obtaining portion for obtaining specifics information about one or more three-dimensional measuring devices, a determining portion for determining a measurable partthat can be measured by the three-dimensional measuring device about a surface shapeof the measurement object in accordance with the obtained arrangement information,the obtained design shape information and the obtained specifics information, and anoutput portion for outputting the determined measurable part.
申请人：KONICA MINOLTA SENSING, INC.
地址：3-91 Daisennishi-machi Sakai-shi, Osaka 590-8551 JP
国籍：JP
代理机构：HOFFMANN EITLE
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