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Method and Lithography Device with a Mask Reflect

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专利名称:Method and Lithography Device with a Mask

Reflecting Light

发明人:Hans-Jürgen MANN,Martin

Lowisch,Wolfgang Singer

申请号:US13073629申请日:20110328

公开号:US20110229827A1公开日:20110922

专利附图:

摘要:A method and lithography device addressing the problem in projection opticsof pupil apodization which leads to imaging defects. As here proposed, the illumination

system is configured to illuminate the mask inhomogeneously. As a result,

inhomogeneities in reflectivity caused by the mask itself are at least partly counteracted.This compensation not only makes the apodization over the pupil become moresymmetric but also makes the intensity variation smaller overall.

申请人:Hans-Jürgen MANN,Martin Lowisch,Wolfgang Singer

地址:Oberkochen DE,Oberkochen DE,Aalen DE

国籍:DE,DE,DE

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