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专利名称：TEST APPARATUS AND TEST METHOD发明人：Hiroshi Kanasugi申请号：US123668申请日：20090206
公开号：US20100042878A1公开日：20100218
专利附图：
摘要：Provided is a test apparatus for testing a plurality of devices under test, thetest apparatus including: a data supplying section that concurrently supplies test data tothe plurality of devices under test; a writing control section that controls the test data tobe concurrently written to the plurality of devices under test; and a reading control
section that successively reads the test data from each of the plurality of devices undertest. The plurality of devices under test may be a plurality of memories under test.
申请人：Hiroshi Kanasugi
地址：Tokyo JP
国籍：JP
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