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TC74VHCT125AF_07资料

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TC74VHCT125,126AF/AFN/AFT/AFK

TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic

TC74VHCT125AF,TC74VHCT125AFN,TC74VHCT125AFT,TC74VHCT125AFK

TC74VHCT126AF,TC74VHCT126AFN,TC74VHCT126AFT,TC74VHCT126AFK

TC74VHCT125AF/AFN/AFT/AFK Quad Bus Buffer TC74VHCT126AF/AFN/AFT/AFK Quad Bus Buffer

The TC74VHCT125A/126A are high speed CMOS QUAD BUS BUFFERs fabricated with silicon gate C2MOS technology. They achieve the high speed operation similar to equivalent Bipolar Shottky TTL while maintaining the CMOS low power dissipation.

The TC74VHCT125A requires the 3-state control input G to be set high to place the output into the high impedance state, whereas the TC74VHCT126A requires the control input G to be set low to place the output into high impedance.

The input voltage are compatible with TTL output voltage. This device may be used as a level converter for interfacing 3.3 V to 5 V system.

Input protection and output circuit ensure that 0 to 5.5 V can be applied to the input and output (Note) pins without regard to the supply voltage. There structure prevents device detsruction due to mismatched supply and input/output voltages such as battery back up, hot board insertion, etc.

Note: VCC = 0 V

Note: xxxFN (JEDEC SOP) is not available in

Japan. TC74VHCT125AF, TC74VHCT126AF

TC74VHCT125AFN, TC74VHCT126AFN

TC74VHCT125AFT, TC74VHCT126AFT

Features

• High speed: tpd = 3.8 ns (typ.) at VCC = 5 V

• Low power dissipation: ICC = 4 μA (max) at Ta = 25°C • Compatible with TTL outputs: VIL = 0.8 V (max)

VIH = 2.0 V (min)

• Power down protection is provided on all inputs and outputs. • Balanced propagation delays: tpLH∼ − tpHL • Low noise: VOLP = 0.8 V (max)

• Pin and function compatible with the 74 series

(74AC/HC/F/ALS/LS etc.) 125/126 types.

Weight

SOP14-P-300-1.27A SOL14-P-150-1.27

TSSOP14-P-0044-0.65A VSSOP14-P-0030-0.50

: 0.18 g (typ.) : 0.12 g (typ.) : 0.06 g (typ.) : 0.02 g (typ.)

TC74VHCT125AFK, TC74VHCT126AFK

12007-10-02

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TC74VHCT125,126AF/AFN/AFT/AFK Pin Assignment

TC74VHCT125A 1G1A 1Y

1 2 3 14 13 12 11 10 9 8

VCC

TC74VHCT126A 1G1A1Y2G2A2YGND

1234567

(top view)

14 13 12 11 10 9 8

VCC4G 4A 4Y 3G 3A 3Y

4G 4A 4Y 3G

2G 4 2A 2Y GND

5 6 7 (top view)

3A 3Y

IEC Logic Symbol

TC74VHCT125A

1G 1A2G 2A3G 3A4G 4A

(1) (2) (4) (5) (10) (9) (13) (12)

EN

(3) (6) (8) (11)

1Y 2Y 3Y 4Y

1G1A2G2A3G3A4G4A

(1)(2)(4)(5)(10)(9)(13)(12)

TC74VHCT126A EN

(3) (6) (8) (11)

1Y 2Y 3Y 4Y

Truth Table

TC74VHCT125A

Inputs Output Y Z L H TC74VHCT126A

Inputs G

A

Output Y Z L H

G A H X L L L H L X H L H H X: Don’t care Z: High impedance

X: Don’t care Z: High impedance

22007-10-02

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TC74VHCT125,126AF/AFN/AFT/AFK Absolute Maximum Ratings (Note 1)

Characteristics Symbol Supply voltage range DC input voltage DC output voltage Input diode current Output diode current DC output current DC VCC/ground current Power dissipation Storage temperature

VCC VIN VOUT IIK IOK IOUT ICC

Rating −0.5 to 7.0 −0.5 to 7.0 −0.5 to 7.0 −0.5 to VCC + 0.5

Unit V V

(Note 2)(Note 3)

V

−20 mA ±20 (Note 4)mA ±25 mA ±50 mA PD 180 mW Tstg

−65 to 150

°C

Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or

even destruction.

Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: Output in off-state

Note 3: High or low state. IOUT absolute maximum rating must be observed.

Note 4: VOUT < GND, VOUT > VCC

Operating Ranges (Note 1)

Characteristics Symbol Supply voltage Input voltage Output voltage Operating temperature Input rise and fall time

VCC VIN VOUT Topr dt/dv

Rating 4.5 to 5.5 0 to 5.5 0 to 5.5

(Note 2)

Unit V V V °C ns/V

0 to VCC (Note 3)−40 to 85

0 to 20

Note 1: The operating ranges must be maintained to ensure the normal operation of the device.

Unused inputs must be tied to either VCC or GND. Note 2: Output in off-state Note 3: High or low state

32007-10-02

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TC74VHCT125,126AF/AFN/AFT/AFK Electrical Characteristics

DC Characteristics

Ta = 25°C Min2.0

Typ.⎯

Characteristics Symbol Test Condition

Ta = −40 to 85°C

Max Min MaxVCC (V)4.5 to 5.54.5 to 5.5

Unit

High-level input voltage Low-level input voltage

High-level output voltage

Low-level output voltage Input leakage current 3-state output off-state current

VIH

⎯ ⎯ 2.0 ⎯ V VIL

⎯ ⎯ ⎯ 0.8 ⎯ 0.8 V VOH VIN = VIH or VIL

IOH = −50 μA 4.5IOH = −8 mA

4.5

4.403.94

4.50⎯

⎯ 4.40 ⎯ ⎯ 3.80 ⎯

V

VOL VIN = VIH or VIL

IOL = 50 μA 4.5IOL = 8 mA

4.50 to 5.55.55.55.50

⎯ 0.0 0.1 ⎯ 0.1 ⎯ ⎯

⎯ 0.36 ⎯ 0.44⎯

±0.1

±1.0

V

IIN VIN = 5.5 V or GND VIN = VIH or VIL VOUT = VCC or GND VIN = VCC or GND Per input: VIN = 3.4 V Other input: VCC or GND VOUT = 5.5 V

μA

IOZ ICC

⎯ ⎯ ⎯ ⎯

⎯ ±0.25 ⎯ ±2.50μA μA

⎯ 4.0 ⎯ 40.0⎯ 1.35 ⎯ 1.50Quiescent supply current Output leakage current

ICCT IOPD

mA ⎯ 0.5 ⎯ 5.0 μA

AC Characteristics (input: tr = tf = 3 ns)

Characteristics Symbol Test Condition

Ta = 25°C

CL (pF)15 50

RL = 1 kΩ 5.0 ± 0.5

15 50 50

Min

Typ.

Max

Ta =

−40 to 85°C Min

Max

ns Unit

Propagation delay time

Output enable time

tpLH tpHL tpZL tpZH tpLZ tpHZ tosLH tosHL CIN COUT CPD

VCC (V)

⎯ 5.0 ± 0.5

⎯ 3.8 5.5 1.0 6.5 ⎯ 5.3 7.5 1.0 8.5 ⎯ 3.6 5.1 1.0 6.0 ⎯ 5.1 7.1 1.0 8.0 ⎯ 6.1 8.8 1.0 10.0

ns

Output disable time

RL = 1 kΩ 5.0 ± 0.5

ns Output to output skew Input capacitance Output capacitance Power dissipation

capacitance

(Note 1)5.0 ± 0.5⎯ ⎯

50 ⎯ ⎯ 1.0 ⎯ 1.0 ns ⎯ 4 10 ⎯ 10 pF ⎯ 6 ⎯ ⎯ 14 ⎯ ⎯ 15 ⎯

⎯ ⎯ ⎯

⎯ pF ⎯ ⎯

TC74VHCT125A

(Note 2) TC74VHCT126A

pF

Note 1: Parameter guaranteed by design.

tosLH = |tpLHm − tpLHn|, tosHL = |tpHLm − tpHLn|

Note 2: CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating

current consumption without load.

Average operating current can be obtained by the equation:

ICC (opr) = CPD·VCC·fIN + ICC/4 (per gate)

42007-10-02

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TC74VHCT125,126AF/AFN/AFT/AFK Noise Characteristics (input: tr = tf = 3 ns)

Characteristics Symbol Test Condition

Quiet output maximum dynamic VOL Quiet output minimum dynamic VOL Minimum high level dynamic input voltage Maximum low level dynamic input voltage

VOLP VOLV VIHD VILD

CL = 50 pF CL = 50 pF CL = 50 pF CL = 50 pF

Ta = 25°C Typ. Limit0.5 −0.5

UnitV V

VCC (V) 5.0 5.0 5.0 5.0

0.8 −0.8

⎯ 2.0 V ⎯ 0.8 V

52007-10-02

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TC74VHCT125,126AF/AFN/AFT/AFK Package Dimensions

Weight: 0.18 g (typ.)

62007-10-02

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TC74VHCT125,126AF/AFN/AFT/AFK Package Dimensions (Note)

Note:

This package is not available in Japan.

Weight: 0.12 g (typ.)

72007-10-02

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TC74VHCT125,126AF/AFN/AFT/AFK Package Dimensions

Weight: 0.06 g (typ.)

82007-10-02

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TC74VHCT125,126AF/AFN/AFT/AFK Package Dimensions

Weight: 0.02 g (typ.)

92007-10-02

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TC74VHCT125,126AF/AFN/AFT/AFK

RESTRICTIONS ON PRODUCT USE

• The information contained herein is subject to change without notice.

20070701-EN GENERAL

• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property.

In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.

102007-10-02

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